Apogee Semiconductor AP54RHC00 Rad-Hard Quad 2-input NAND Gate ICs
Apogee Semiconductor AP54RHC00 Rad-Hard Quad 2-input NAND Gate ICs are members of the AP54RHC logic family operating across a 1.65VDC to 5.5VDC voltage supply range. These NAND gate ICs are fabricated in a 180nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to Single Event Effects (SEE). A proprietary output stage and robust Power-On Reset (POR) circuit allow the AP54RHC00 to be cold-spared in any redundant configuration with no static power loss. The AP54RHC00 NAND gate ICs support zero-power penalty cold-sparing and class 2 ESD protection on all inputs and outputs.
The AP54RHC00 NAND gate ICs feature built-in triple redundancy for enhanced reliability, logic-level down translation to VCC, and TID resilience of 30krad (Si). These gate ICs also feature a 17ns propagation delay time and operate between -55°C to 125°C extended operating temperature range. The AP54RHC00 NAND gate ICs are ideally used in space and medical imaging applications.
Features
- Provides logic-level down translation to VCC
- Proprietary cold-sparing capability with zero static power penalty
- Built-in triple redundancy for enhanced reliability
- Internal Power-On Reset (POR) circuitry ensures reliable power-up and power-down responses during hot plug and cold-sparing operations
- Class 2 ESD protection (4000V HBM and 500V CDM)
- TID resilience of 30krad (Si)
- SEL resilient up to LET of 80 MeV-cm2/mg
Specifications
- 1.65V to 5.5V input voltage range
- Inputs tolerant up to 5.5VDC at any VCC
- 17ns propagation delay time
- -55°C to 125°C operating temperature range
- -65°C to 150°C storage temperature range
Applications
- Space
- Medical imaging
Logic Diagram
公開: 2022-12-22
| 更新済み: 2024-08-26